Application of Symbolic Circuit Analysis for Failure Detection and Optimization of Industrial Integrated Circuits

Author(s): Ralf Sommer, Dominik Krauße, Eric Schäfer and Eckhard Hennig

Pp: 445-477 (33)

* (Excluding Mailing and Handling)

Abstract

The contribution deals with application of symbolic circuit analysis for failure detection and optimization of industrial integrated circuits. It demonstrates how symbolic analysis and approximation allows analyzing industrial analog building blocks systems, which were considered to be symbolically unsolvable before. Besides circuit failure analysis and modeling, a novel methodology that provides a new applicationspecific compensation for achieving highest performance requirements, is given. The methodology is demonstrated on several industrial examples.

Keywords: Symbolic circuit analysis, circuit failure detection, optimization of industrial integrated circuits, symbolic approximation, frequency behavior, circuit compensation, generalized eigenvalue problem, approximate eigenvalue extraction, poles and zeroes of transfer factions, model order reduction, SBG (simplification before generation), term ranking, eigenvalue sensitivity, Modal Assurance Criterion (MAC), MNA (Modified Nodal Analysis), STA (Sparse Tableau Analysis), smallsignal equivalent circuits, BSIM small signal model, industrial CMOS operational amplifier, Analog Insydes, frequency compensation, Nyquist criterion, automated topology modification, direct compensation, compensation network, Analog Insydes.