Abstract
In the present chapter, brief history, working principle, instrumentation and, recent applications of Scanning Electron Microscopy (SEM) have been enlightened. SEM is a highly sensitive and efficient magnification tool that exploits focused beams of electrons to obtain information allied to topography, morphology, and composition of materials. Utilization of SEM techniques in different fields, like various domains of materials science, forensic investigation, mechanical engineering, biological, and medical sciences has been discussed.
Keywords: Electron beam, Scanning electron microscopy.
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